ID Number		1544
Study Type		Engineering & Physics
Model		Numerical modeling of to determine ELF component and exposure produced by battery circuit of mobile phones
Details		Numerical modeling of an MRI image of a 30-year-old female using the finite element method (FEM, computes current at the center of each voxel) or finite integration technique (FIT, provides normal component of current on face of each voxel) was performed to determine current densities induced in the head by the low-frequency fields emitted by the battery circuit in mobile phones. The authors report these are well within ICNIRP guidelines. A previous study using a spherical model of the head reported that calculated current densities did not exceed but "were not far from" ICNIRP or IEEE limits.
Findings		Not Applicable to Bioeffects
Status		Completed With Publication
Principal Investigator		Helsinki University of Technology, Finland
Funding Agency		Nat'l Res Prog, Finland, Nokia
Country		FINLAND
References		Ilvonen, S et al. Bioelectromagnetics, (2005) 26:648-656
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